Interactive Experimental Methodology Matcher

Decision-tree utility matching scientific characterization targets (crystal lattice fringes, surface 3D roughness, elemental oxidation states, electronic band structures) to optimal laboratory instruments.

Interactive Methodology Matcher

Match Your Experimental Target to the Optimal Technique

Select your characterization challenge below for an instrument-calibrated protocol recommendation.

Protocol Recommendation

High-Resolution TEM (HRTEM) & STEM-HAADF

Target Instrument: Transmission Electron Microscope (200-300 kV)

Open Topic & Guide →

Critical Tuning Parameter:

Cs-corrector tuning, low dose for beam-sensitive specimens

Sample Prep Reality:

Specimen must be <50 nm thin. Use Ar+ ion mill or cryogenic FIB.

Open-Source Toolkit:

HyperSpy / pyXem ↗

Input Requirements & Procedure

Required Inputs:

•Characterization target (Structural, Surface, Chemical, or Optical)
•Sample state (Solid powder, Thin film, Liquid dispersion, Biological)
•Spatial resolution target (Atomic <0.2 nm, Nanoscale 1-50 nm, Microscale >1 μm)

Operating Instructions:

Step through the decision tree by selecting what physical property you need to quantify.
Review the recommended primary analytical instrument and complementary verification tool.
Inspect sample preparation limits (thickness, conductivity, substrate choice) before scheduling instrument time.

Scientific Scope & Limitations

⚠️Instrument recommendations reflect standard academic core facility configurations.
⚠️Specific beamline or ultra-high vacuum requirements may necessitate dedicated synchrotron or cryo facilities.

Citations & Primary Standards:

[1] Goodhew, P. J., Humphreys, J., & Beanland, R. "Electron Microscopy and Analysis." CRC Press, 2020.
[2] Briggs, D., & Grant, J. T. "Surface Analysis by XPS and AES." IM Publications, 2003.

Related Masterclasses & Method Protocols

📓 METHOD PROTOCOL

Nanostructural Microscopy: Instrument Selection Guide

Read Protocol →

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METHODOLOGY SELECTORNanostructural Microscopy & Imaging✓ Free & Open Source