METHODOLOGY PROTOCOLNanostructural Microscopy & Imaging
Nanostructural Microscopy: Instrument Selection Guide
Matching spatial scale and sample requirements: SEM for morphology, HR-TEM for crystal lattices, and AFM for surface roughness.
Scientific Principles & Procedural Takeaways
1
SEM Resolution: ~1-5 nm; ideal for overall morphology and fracture surfaces.
2
TEM Resolution: Sub-Angstrom with spherical aberration correction; requires specimens thinned below 50 nm.
3
AFM Resolution: ~0.1 nm vertical resolution; operates without vacuum, providing 3D quantitative height maps.
⚙ Critical Instrument Parameters
Settings & Acquisition Nuances
Accelerating voltage (SEM: 1-15 kV, TEM: 80-300 kV), probe current, working distance, detector mode (SE vs BSE).
⚠️ Critical Bench Pitfall & Troubleshooting
Common Artifacts & Prevention
Surface charging in non-conductive specimens under electron beam. Apply 2-5 nm Au/Pd or carbon sputter coating.